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| Instron servo-hydraulic test rig | Mechanical characterization | Instron | Instron 8032 |
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| Large electrodynamic shaker | Acoustical characterization | Ling Dynamic Systems | LDS V964LS |
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| Shaker for acoustic absorbent materials | Acoustical characterization | - | - |
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| Tube apparatus for acoustic absorption measurements | Acoustical characterization | - | - |
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| 1 kN Biaxial materials testing machine | Mechanical characterization | Zwick/Roell | Zwick/Roell 1 kN |
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| 1 kN Materials testing machine | Mechanical characterization | Instron | Instron 1 kN |
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| 10 MN Materials testing machine | Mechanical characterization | MTS | MTS 10 MN |
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| 100 kN Materials testing machine | Mechanical characterization | MTS | MTS 100 kN |
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| 160 kN-1100 Nm Materials testing machine | Mechanical characterization | MTS | MTS 160 kN |
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View
| 250 kN Dynamic load frame with triaxial cell | Mechanical characterization | MTS | TestStar II m |
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| 30 kN Materials testing machine | Mechanical characterization | MTS | MTS 30 kN |
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| 3D Analysis Software for Materials Science | Tomography | AVIZO | FIRE |
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| 500 kN Materials testing machine | Mechanical characterization | MTS | MTS 500 kN |
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| Accutom-5 Precision cutter | Sample preparation | Struers | Accutom-5 |
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View
| ACM Bandsaw | Sample preparation | ACM | BS 640 |
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View
| Advanced Stress Path Triaxial Testing System | Mechanical characterization | GDS | ADVTTS - 70/100mm 25kN |
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| Asphalt Mixer | Sample preparation | Matest | B027 |
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View
| Asphalt Mixture Performance Tester, AMPT/SPT | Mechanical characterization | IPC Global | AMPT/SPT |
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View
| Automated Saw | Sample preparation | IPC Global | Autosaw |
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| Band saw | Sample preparation | - | - |
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View
| Bending Beam Rheometer, BBR | Rheological characterization | CANNON | 01 |
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| Brookfield Viscometer | Rheological characterization | Brookfield | RVDV-II+ |
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View
| Buehler Simplimet Mounting press | Sample preparation | Buehler | Simplimet 2000 |
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View
| Carbolite Tube furnace | Thermal processes | Carbolite | unknown |
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View
| Ceramic hotplate | Thermal processes | IKA | C-MAG HP 10 |
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View
| Confocal Mic. META | Optical Microscopy | Zeiss | LSM 510 META |
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View
| Confocal Mic. PASCAL | Optical Microscopy | Zeiss | LSM 5 PASCAL |
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View
| Deckel Mill | Sample preparation | Deckel | - |
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View
| Diode-pumped solid-state laser | Laser Systems | Cobolt | Samba 50 |
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View
| Drop Shape Analysis System - Sessile drop | Chemical characterization | KRÜSS | DSA100 |
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View
| Ductilometer | Rheological characterization | Strassentest | F7546 |
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View
| Dynamic Analyzer Rheometer | Rheological characterization | Rheometrics | RDA II |
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View
| Dynamic Contact Angle (DCA) analyzer - Wilhelmy plate | Chemical characterization | Thermo Scientific | DCA Radian 315 Analyzer |
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View
| Dynamic Mechanical Analyzer, DMA | Rheological characterization | TA Instruments | Q800 |
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View
| Dynamic stiffness test rig | Mechanical characterization | - | - |
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View
| Electric Mixing Tray | Sample preparation | InfraTest | 2016012 |
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View
| Entech Tube furnace | Thermal processes | Entech | unknown |
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View
| Environmental chamber | Mechanical characterization | MTS | 651 |
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View
| FEI CM120 | Electron Microscopy | Philips | FEI CM120 |
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View
| Flow resistance meter | Acoustical characterization | - | - |
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View
| Foam bitumen mixer | Sample preparation | Wirtgen | WLM 30 |
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View
| Foam bitumen plant | Sample preparation | Wirtgen | WLB 10 |
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View
| Furnace | Thermal processes | Carbolite | HT17 |
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View
| Gatan Dimple grinder | Sample preparation | Gatan | Dimple Grinder 650 |
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View
| Gatan Precision ion polishing system | Sample preparation | Gatan | PIPS 691 |
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View
| Gyratory compactor | Sample preparation | IPC Global | Servopac |
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View
| HBM MGCplus Data Acquisition System | Other Characterization | HBM | MGCplus |
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View
| HBM QuantumX 8-channel Universal Amplifier | Other Characterization | HBM | QuantumX MX840A |
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View
| Heraeus Climate Chamber | Mechanical characterization | Weiss Technik | JT 5050E |
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View
| High-resolution Computed Tomography System | Tomography | North Star Imaging, Inc. | X-View™ X5000-CT |
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View
| High-temperature graphite furnace | Thermal processes | Thermal Technology Inc. | - |
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View
| Holytech Sander Machine | Sample preparation | HOLYTEK | - |
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View
| Instron Universal Test Machine 100 kN | Mechanical characterization | Instron | 4505 |
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| Instron Universal Test Machine 30 kN | Mechanical characterization | Instron | 5567 |
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View
| Inverse gas chromatography | Chemical characterization | SMS Surface Measurement Systems | iGC Surface Energy Analyzer (SAE) |
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View
| IR camera | Other Characterization | Princeton Instruments | I-MAX 1024 E.25/G (Roper Scientific) |
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View
| Isomet 5000 Precision cutter | Sample preparation | Buehler | Isomet 5000 |
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View
| JEOL 2100F | Electron Microscopy | JEOL | JEOL 2100F |
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View
| JEOL 3000SFF | Electron Microscopy | JEOL | JEOL 3000SFF |
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View
| LabEcon 600 Hot Press | Mechanical characterization | LabEcon 600 | Fontijne Presses |
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View
| Laser oscillator Ti:Sapphire | Laser Systems | Spectra-Physics | 3900S |
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View
| Lathe | Sample preparation | - | - |
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View
| LEICA CLS150 | Optical Microscopy | LEICA | LEICA CLS150 |
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View
| LEICA DMRM | Optical Microscopy | LEICA | LEICA DMRM |
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View
| Leitz micro-Vickers indenter | Mechanical characterization | Leitz | unknown |
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View
| LIMS testtool | Other processes | Test Inc. | LIMS test |
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View
| Mass spectrometer | Spectroscopy | Hiden Analytical | Hiden QGA |
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View
| Matsuzawa micro-Vickers indenter | Mechanical characterization | Matsuzawa | MXT CX-1 |
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View
| Metal bath Bi-Sn | Thermal processes | unknown | unknown |
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View
| Milling machine | Sample preparation | - | - |
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View
| MTS 100 kN dynamic load frame | Tomography | MTS | 810 |
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View
| MTS 100 kN dynamic load frame (Superpave IDT Test) | Mechanical characterization | MTS | 810 |
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View
| MTS 204 Actuator 160 kN | Mechanical characterization | MTS | 204 |
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View
| MTS 204 Actuator 350 kN | Mechanical characterization | MTS | Actuator model 204 |
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| MTS 244 Actuator 15 kN | Mechanical characterization | MTS | 244 |
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View
| MTS 244 Actuator 50 kN | Mechanical characterization | MTS | 244 |
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| MTS 810 Material Testing System | Mechanical characterization | MTS | MTS 810 - Model 311 |
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View
| MTS 815 Rock mechanics and concrete testing system | Mechanical characterization | MTS | MTS 815 (Load frame model: 315.05) |
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View
| MTS Load Frame 312.21 | Mechanical characterization | MTS | 312.21 |
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View
| MXR-160HP/11 X-ray tube | Spectroscopy | COMET | MXR-160HP/11 |
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View
| Mössner Bandsaw | Sample preparation | Mössner | - |
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View
| Nabertherm Muffle furnace | Thermal processes | Nabertherm | C19 |
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View
| Nd:Yag laser | Laser Systems | Litron Lasers | Nano T 250-20 |
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View
| Neutron activation and analysis instrument | Spectroscopy | - | - |
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View
| Olympus BX50 Microscope and Polishing Machine | Optical Microscopy | Leica | Olympus BX50 |
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View
| Olympus Light optical microscope | Optical Microscopy | Olympus | PMG3 |
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View
| Optical fiber spectrum analyzer | Other Characterization | Agilent | 86140B |
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View
| Oven with mechanical convection (240 lt) | Sample preparation | Binder | FP 240 |
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View
| Oven with mechanical convection (240lt) | Thermal processes | Binder | FP 240 |
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View
| Oven with mechanical convection (720lt) | Thermal processes | Binder | FP 720 |
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View
| Phoenix 1000 Manual polishing | Sample preparation | Buehler | Phoenix 1000 |
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View
| Phoenix 4000 Automatic polishing | Sample preparation | Buehler | Phoenix 4000 |
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View
| Picosecond Diode Laser Driver and Laser Diode Head | Laser Systems | PicoQuant | PDL 800-D |
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View
| Platinum Temperature Chamber system | Tomography | ESPEC | EGNU12-6CWL |
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View
| Polishing machine | Sample preparation | Logitech | PM5 Precision Lapping & Polishing System |
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View
| Polytec Laser Doppler equipment for vibration measurements | Acoustical characterization | Polytec | Polytec OFV 303 |
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View
| Powerpro 5000 Automatic polishing | Sample preparation | Buehler | Poerpro 5000 |
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View
| Precise Controlled Atmosphere Glove Boxes | Sample preparation | Labconco | Precise Controlled Atmosphere Glove Box |
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View
| Pressure Aging Vessel, PAV | Rheological characterization | Gilson Company, Inc | PAV 9300 |
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View
| PW 1830/40 X-ray Source | Spectroscopy | Philips | PW 1830/40 |
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View
| Reverberation room | Acoustical characterization | - | - |
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View
| Rolling Thin Film Oven, RTFOT | Rheological characterization | James Cox & Sons Inc | CS 325-A |
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View
| Rotating bar bend fatigue testing machine | Mechanical characterization | Solid Mechanics | Öberg 1 |
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View
| Schenck MTS Fatigue Testing Machine | Mechanical characterization | Schenck | MTS |
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View
| Schenck PSB 250 Fatigue Testing Machine | Mechanical characterization | Schenck | Hydropuls PSB 250 |
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View
| Schenk PSA 10 kN Fatigue Testing Machine | Mechanical characterization | Instron-Schenck | Hydropuls PSA 04 |
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View
| Semiconductor laser | Laser Systems | Toptica | BlueMode |
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| Single photon detector | Other Characterization | PerkinElemer | - |
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View
| Small electrodynamic shaker | Acoustical characterization | Brüel & Kjær | 4817/+4802 |
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View
| Supercomputer, Dell Precision Workstation R5500 Rack Mounted | Other processes | Dell Inc. | Precision Workstation R5500 |
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View
| Tensiometer | Chemical characterization | KSV Instruments | Sigma 70 |
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View
| Test Sieve Shaker | Sample preparation | Haver | EML450 digital plus T |
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View
| Thermostatic visibility bath | Rheological characterization | Tamson | TV4000 |
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View
| Ti: Sapphire laser | Laser Systems | Spectra- Physics | Tsunami |
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View
| Ti:Sapphire amplifier | Laser Systems | Coherent | Legend |
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View
| Tube furnace 3 | Thermal processes | unknown | unknown |
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View
| Tube furnace 4 | Thermal processes | unknown | unknown |
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View
| Ultrasonic disc cutter TEM | Sample preparation | Gatan | Ultrasonic disc cutter 601 |
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View
| Universal Sorption Device | Chemical characterization | Rubotherm | 200+-00775-swe |
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View
| UV excimer laser | Sample preparation | GSI Lumonics | PulseMaster PL800 |
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View
| Vacuum chamber with electrodynamic shaker | Acoustical characterization | - | - |
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View
| Weiss Climate Chamber | Mechanical characterization | Weiss Technik | - |
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View
| VP Scanning electron microscope | Electron Microscopy | Hitachi | S3700N |
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| XR-100CR X-ray Detector, Preamplifier and Cooling System | Spectroscopy | Amptek | XR-100CR |